Measurement system to determine the seebeck coefficient and electrical conductivity of thin films.
PEREIRA, Gustavo Gonçalves Dalkiranis; BOCCHI, João Henrique Cirilo; TORRES, Bruno Bassi Millan; LOPEANDIA-FERNÁNDEZ, Aitor; OLIVEIRA JUNIOR, Osvaldo Novais de; FARIA, Gregório Couto.
PEREIRA, Gustavo Gonçalves Dalkiranis; BOCCHI, João Henrique Cirilo; TORRES, Bruno Bassi Millan; LOPEANDIA-FERNÁNDEZ, Aitor; OLIVEIRA JUNIOR, Osvaldo Novais de; FARIA, Gregório Couto.